Berthold France presents APM 3DLevelScanner product line in CFIA 2012- Rennes, France

Dates: 13-15.3.2012
Open hours
: 9:00 - 18:00
Venue
: Rennes, France
Location: Parc des Expositions de Rennes, Hall 5, Berthold France Stand #E38

3DLevelScanner volume measurement

CFIA is the leading trade show for the food processing players . The Rennes show brings together quality visitors from all functions of the plant. With over 200 businesses and 1,300 exhibitors represented at the forefront of innovation, the CFIA is now the best ambassador of French know-how in agribusiness.

APM wishes to invite you to visit Berthold stand to see the APM line of products for bulk solids volume and level measurement.

No more inaccurate calculations based on a single sample point, but a unique family of devices that generate
3-dimensional maps of the content of the silo/open bin/warehouse.

APM’s innovative technology is the best-of-class solution for accurate measurement of bulk solids, particularly those in dusty environments

For the first time in the solids industry 3DLevel measurement provides true and accurate measures of volume and mass of silo contents – an achievement of critical importance for all solid industries.

3D Mapping of the surface area

3D visualization

You want to visit APM at the exhibition?
We are pleased to welcome you. You can directly make an appointment with our distributor.
A short e-mail is sufficient: berthold-france@berthold.com

PDF version

Thank you