Beijing Jinde presents 3DLevelScanner product line in Miconex 2012 Shanghai, China


Dates
: 21-24.8.2012
Venue: Shanghai, China 
Location: Shanghai World Expo Exhibition And Convention Center

3DLevelScanner volume measurementMiconex is a leading fair of measuring instruments and automation. The event brings in exhibitors from different parts of the world manufacturing products related to this industry. All the developments that have taken place in this sector are showcased in this event. The presence of all key players of this sector gives way to exchange of ideas and opinions which leads to many future innovations in this field.

APM wishes to invite you to visit Beijing Jinde stand to see the APM line of products for bulk solids volume and level measurement.

No more inaccurate calculations based on a single sample point, but a unique family of devices that generate
3-dimensional maps of the content of the silo/open bin/warehouse.

APM’s innovative technology is the best-of-class solution for accurate measurement of bulk solids, particularly those in dusty environments.

For the first time in the solids industry 3DLevel measurement provides true and accurate measures of volume and mass of silo contents – an achievement of critical importance for all solid industries.

 

3D Mapping of the surface area


You want to visit APM at the exhibition?
We are pleased to welcome you. You can directly make an appointment with our distributor.
A short e-mail is sufficient: jdscb@jdcontrol.com

Thank you